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廈門岳航計(jì)算機(jī)工程有限公司
主營(yíng)產(chǎn)品： AB|GE|ABB|霍尼韋爾|英維思|西門子|福克斯波羅|施耐德|西屋 |
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廈門岳航計(jì)算機(jī)工程有限公司
主營(yíng)產(chǎn)品： AB|GE|ABB|霍尼韋爾|英維思|西門子|福克斯波羅|施耐德|西屋 |
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VAT Large Stainless Steel Gate Valve
Varian 1245-L8500-302 Manual Gate Valve New, Never Used
HVA 11212-1009RB-00 High Vacuum Gate Valve
HVA 11212-1009RS-001 High Vacuum Stainless Steel Gate Valve
HVA 11212-1009RB-001 High Vacuum Stainless Steel Gate Valve
Veeco-Bruker Wyko SP9900 Large Format Optical Surface Profiler
Veeco Dektak 3 Surface Profiler
ASYST SMIF-300WMS Wafer Management System
Gaertner L106C Large Stage Ellipsometer
Gaertner L-26 Simple Manual Ellipsometer with PC Controller
GSI Lumonics VOY 1212 Metrology System
Angstrom Advanced PHE101 Discrete Wavelength Ellipsometer
KLA Tencor Auto RS55/tc Four Point Probe Resistivity Mapping System
JMAR S2610-01 3-Axis Tabletop Measurement System
KLA-Tencor AS-500 Stylus Based Surface Profiler
Tencor AS 200 Alpha Step 200 Stylus Based Surface Profiler
Tencor AS 500 Stylus Based Surface Profiler
Metricon 2010 Prism Coupler Dual Laser Film Measurement System
Metricon PC-200 Prism Coupler
Metricon PC-2000 Thin Film Thickness and Refractive Index Measurement System
Philips PLM-100 Photoluminescence Mapping Tool
Prometrix UV-1050 Film Thickness Mapping System
Rudolph AutoEl III Ellipsometer
MTI Proforma 300 Non-Contact Wafer Thickness Gage
Tencor P20H Long Scan Profiler
Tencor Surfscan AIT Model 8010 Advanced In-Line Defect Inspection System
Flexus F2320 Dual Wavelength 500deg C Scanning Thin Film Stress Measurement Sys
Sun International/SOPRA GESP-5 Variable Angle Spectroscopic Ellipsometer
Tencor AS 500 Stylus Based Surface Profiler
Rudolph Auto El III Ellipsometer
Wyko BP2000W Bump Measurement Profiling System
Zygo NV 5000 5022 NewView 5000 Precise Rapid Noncontact 3D Surface Profiling
Zygo SXM300 Multimode Scanning Probe Microscope
Tencor P-11 Long Scan Surface Profiler
